Search by job, company or skills

Senior Staff DFT Engineer

Senior Staff DFT Engineer

encharge ai
10-14 Years
Not Disclosed
  • Posted 7 days ago
  • Be among the first 10 applicants

Job Description

(www.enchargeai.com)

Senior Staff DFT Engineer

The 10 Hottest Semiconductor Startups Of 2025 (So Far)

https://www.crn.com/news/components-peripherals/2025/the-10-hottest-semiconductor-startups-of-2025-so-farpage=1

1

https://www.enchargeai.com/blog/the-efficiency-imperative-energy-will-define-ais-next-chapt

er

Location: Greater Bengaluru Area (Hybrid-2 days office,3 days-home) or Remote (any where in I

ndia

About Com

pany:EnCharge AI is a leader in advanced AI hardware and software systems for edge-to-cloud computing. EnCharge's robust and scalable next-generation in-memory computing technology provides orders-of-magnitude higher compute efficiency and density compared to today's best-in-class solutions. The high-performance architecture is coupled with seamless software integration and will enable the immense potential of AI to be accessible in power, energy, and space constrained applications. EnCharge AI launched in 2022 and is led by veteran technologists with backgrounds in semiconductor design and AI sys

tems.

Developing silicon for Edge Computing isn't just about speed; it's about balancing high-performance data processing with extreme power efficiency and reliability in remote enviro

nments.

As the Design for Test (DFT) Senior staff, you will be the architect of our testing strategy, ensuring our data center chips are flawlessly manufacturable and resilient enough for edge dep

loyment.

Key Respons

ibilitiesArchitectural Leadership: Define and implement the end-to-end DFT architecture for complex SoCs, including Hierarchical DFT, Scan compression, a

nd MBIST.

Edge-Specific Reliability: Develop strategies for In-System Test (IST) and power-on self-test (POST) to ensure chip health in remote edge dat

a centers.

Implementation & Flow: Oversee scan insertion, ATPG (Stuck-at, Transition, Path Delay), and

Logic BIST.

Cross-Functional Synergy: Collaborate with Design, Physical Design, and Yield teams to ensure high test coverage while minimizing area overhead and p

ower impact.

Post-Silicon Validation: Lead the bring-up and debug phase on ATE (Automated Test Equipment) to root-cause silicon failures and optimi

ze test time.

Technica

l RequirementsExperience: 10-14 years in DFT, with at least 2 years in a leadership or p

rincipal role.

Tools: Mastery of industry-standard tools (e.g., Synopsys TestMAX, Siemens/Mentor Tessent, or

Cadence Modus).

Memory & Logic Test: Deep expertise in MBIST (Memory Built-In Self-Test) with repair capabilities and boundary scan

(IEEE 1149.1/6).

Advanced Nodes: Proven track record with FinFET nodes (7nm

, 5nm, or below).

Low Power: Experience managing DFT in multi-voltage/power-gated designs—crucial fo

r edge

effi

ciency.

Contact

Uday

mud[Confidential Information]

Mulya Technologies

Mining the Knowledge Community

More Info

Job Type:
Function:
Employment Type:

Key Skills

Multi-voltage power-gated designs

Synopsys TestMAX

Scan compression

Siemens Mentor Tessent

DFT architecture

Cadence Modus

Hierarchical DFT

Stuck-at

MBIST Memory Built-In Self-Test with repair capabilities

Path Delay

In-System Test (IST)

Power-on self-test (POST)

About Company

Similar Jobs

10-12 yrs
India
Skills:
automation, Scripting, scan compression, BSCAN, MBIST, Siemens Tessent, SSN TestKompress, DFT architecture, ATPG, EDA Tools, Synopsys TetraMAX, DFTMAX, LBIST, IJTAG
8-10 yrs
Bengaluru, India
Skills:
logic bist , DFT architecture, Functional BIST, Digital design flows, Scan compression, SoC MCU architecture, DFT protocols
12-15 yrs
Hyderabad
Skills:
Dft, MBIST, LBIST, ATPG, Scan Insertion, GLS
10-12 yrs
Bengaluru, India
Skills:
occ, Memory-BIST, DFT architecture scan Insertion compression at core level and SoC level, SSN architecture, timing and no-timing simulations, clock architecture, ATPG pattern generation coverage analysis
5-12 yrs
Bengaluru, India
Skills:
Vcs, Perl, Python, Tcl, ATPG Fault Models, DFT Debugging, Siemens Tessent, Synopsys TestMAX, End-to-end DFT implementation, RTL SoC Design Flow, Cadence Modus, STA Timing Closure, MBIST LBIST, DFT Sign-off Fault Coverage, JTAG Boundary Scan – IEEE 1149.1, Scan Insertion Compression