automation, Scripting, scan compression, BSCAN, MBIST, Siemens Tessent, SSN TestKompress, DFT architecture, ATPG, EDA Tools, Synopsys TetraMAX, DFTMAX, LBIST, IJTAG

logic bist , DFT architecture, Functional BIST, Digital design flows, Scan compression, SoC MCU architecture, DFT protocols

Dft, MBIST, LBIST, ATPG, Scan Insertion, GLS

occ, Memory-BIST, DFT architecture scan Insertion compression at core level and SoC level, SSN architecture, timing and no-timing simulations, clock architecture, ATPG pattern generation coverage analysis

Vcs, Perl, Python, Tcl, ATPG Fault Models, DFT Debugging, Siemens Tessent, Synopsys TestMAX, End-to-end DFT implementation, RTL SoC Design Flow, Cadence Modus, STA Timing Closure, MBIST LBIST, DFT Sign-off Fault Coverage, JTAG Boundary Scan – IEEE 1149.1, Scan Insertion Compression