scan compression, DFT architecture, ATPG, Scan Insertion, MBIST, Cadence DFT tools, test coverage analysis

Scan insertion and compression, DFT architecture planning, Boundary scan IEEE 1149.1 1149.6 IJTAG 1687, MBIST, Fault grading, ATPG pattern generation, Logic BIST insertion and validation, Synthesis flows, Rtl Design, Sta

occ, compression at core level, coverage analysis, DFT architecture, Memory-BIST, no-timing simulations, ATPG pattern generation, SSN architecture, timing simulations, Scan Insertion, clock architecture