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Bengaluru, India

Skills:

Perl scriptingDelay FaultsPattern SimulationSiemens TessentTransition FaultsSynopsys TestMAXPattern GenerationDFT CompilerScan InsertionDFT implementationDFT DRC violationsATPGCadence ModusStuck-at Faults

Early Applicant
Bengaluru, India

Skills:

JtagPerlVerilogPythonTclgate-level DFT simulationsScan InsertionCadence DFT EDA toolsMBISTSiemens TessentSynopsys TestMAXsystemverilogDFT implementation and verificationDFT rule checkingATPGscan chain stitchingBoundary Scan BSCAN

Early Applicant
Bengaluru, India

Skills:

boundary scan VerilogPythonCadence ToolsATPGMBISTSynopsys

Early Applicant
Bengaluru, India

Skills:

CMakefileWindowsShellLinuxPerlVerilogRubySystem VerilogSystemcIP level ASIC verificationgraphics pipeline knowledgeHLS toolsUVM testbenchesautomating workflows in a distributed compute environmentdeveloping UVM based verification frameworkssimulation profile efficiency improvementTLMdebugging firmware and RTL code using simulation tools

Early Applicant
Bengaluru, India

Skills:

Full Scan CompressionJTAG Boundary ScanATPG pattern generationScan chainsFault Simulation

Early Applicant
Bengaluru, India

Skills:

CMakefileWindowsShellLinuxPerlVerilogRubySystem VerilogSystemcIP level ASIC verificationgraphics pipeline knowledgeHLS toolsUVM testbenchesautomating workflows in a distributed compute environmentsimulation profile efficiency improvementdebugging firmware and RTL code using simulation toolsUVM based verification frameworksTLM

Early Applicant
Bengaluru, India

Skills:

PerlPythonJTAG IO BISTMemory BISTSVATPGUvm

Early Applicant
Bengaluru, India

Skills:

boundary scan Test Engineeringstatic timing analysisSoc ArchitectureFunctional TestingTest ExecutionTestingcoverage analysislab equipmentdebugging failuresScan InsertionEDA flowsMBISTCadenceDigital DesignTessentRTL synthesissilicon bring-uptest architecturestest patternspattern generationLBISTSynopsysATPG tools

Early Applicant
Bengaluru, India

Skills:

PerlPythonTclDFT rule compliancelow-power DFT methodologiesModus EDTATPG test patternsclock gatingIEEE 1149.1 JTAGDFT architecturepower domain testingIEEE 1500 standardsscan compression techniquesIJTAGscan insertion strategies

Early Applicant
Bengaluru, India

Skills:

Tcl ScriptingPerlDftGate level simulationsZero delay Timing Delay simulationsPD flow knowledgeATPG Pattern generationTiming Formal verificationJTAG P1500 protocolsSCAN DRC Coverage debugScan Insertion

Early Applicant
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