Search by job, company or skills

neurealm

DFT Engineer

Save
new job description bg glownew job description bg glow
  • Posted an hour ago
  • Be among the first 10 applicants
Early Applicant

Job Description

Skills and Experience Required

Hands on experience in Inserting Scan and generating ATPG vectors for

Stuck-At and At-Speed Faults. In-depth experience in analysing and improving scan coverage

Hands on experience in MBIST (insertion and simulation)

Experience in Boundary Scan, inserting tap controller and P1500

Experience in RTL based and netlist-based insertion flows

Experience in DFT simulation with and without SDF Experience in Synthesis and formal verification tools

Experience in characterization (DC Characteristics)

Experience in generating TDL for ATE and working closely with ATE team during bring-up phase

Good exposure to DFT tools from Mentor, Synopsys and Cadence

Good scripting know-how in Perl and TCL

Experience in Static Timing analysis preferred

Educational Qualification: BE/ME or BTech /MTech

About Company

Job ID: 147549427

Similar Jobs

Bengaluru, India

Skills:

PerlShell scriptingDFT verificationSynopsys Tetramax DFTMAXVCS simulation toolIEEE1500Scan memory BISTJTAG 1149.xVerilog RTL designMentor testkompressDesign for Test methodologies

Bengaluru, India

Skills:

boundary scan Digital Logic DesignJtagPerlVerilogLoopbackPythonTclTiming AnalysisMBISTDFT methodologiesSiemens Tessentcircuit fundamentalscompressed scanIEEE 1500IEEE 1687ATPG coverage analysisCadence ModusGenusSDF-based simulations

Bengaluru, India

Skills:

JtagTest StrategyPythonTclcompression boundary scanscan architectureDFT specificationsMBIST repairSTA debugSDCIO and clock constraintsATPGSSN methodologyDFT timing constraints1500 iJTAGhierarchical DFT methodology

Bengaluru, India

Skills:

Tcl ScriptingPerlDftGate level simulationsZero delay Timing Delay simulationsPD flow knowledgeATPG Pattern generationTiming Formal verificationJTAG P1500 protocolsSCAN DRC

Bengaluru, India

Skills:

Jtagstatic timing analysisScripting LanguagesHdlmemory test conceptsECO handlingASIC design flowgate-level simulationscan compressionIEEE 1149.1Scan ATPGDFXVerificationDft