Purpose Of The Role
The Design for Testability (DFT) engineering organization at L&T Semiconductor Technologies (LTSCT) pioneers innovative methods and technologies in the areas of DFT architecture, verification, and post-silicon bring-up of state-of-the-art semiconductor chips, such as System on a Chip (SoCs), developed using the latest semiconductor technology nodes.
Areas Of Responsibilities
Implement various DFT techniques, including:
- Memory Built-In Self-Test (MBIST) insertion.
- Compressor-based scan chain insertion.
- Boundary Scan (BSCAN) structure insertion compliant with IEEE 1149.1 and 1149.6 standards.
- Logic Built-In Self-Test (BIST) for self-test capability.
- Analog BIST implementation for selected analog blocks, such as PLLs, ADCs, and DACs.
- IO Built-In Self-Test (IOBist) methods for IO structures of SoCs.
Conduct DFT simulations and analyze results to ensure comprehensive test coverage and high quality.
Debug and resolve DFT-related issues throughout the design process.
