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  • Posted 9 days ago
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Job Description

Key Responsibilities:

  • Interface with ASIC design teams to ensure DFT design rules and coverages are met.
  • Generate high-quality manufacturing ATPG test patterns for stuck-at (SAF), transition fault (TDF) models through the use of on-chip test compression techniques.
  • MBIST verification (including repair), test pattern generation through Mentor tool.
  • ATPG (SAF, TDF) and MBIST verification using unit delay and min/max timing corner simulations.
  • Work with Product/Test engineering teams on the delivery of manufacturing test patterns for ATE.
  • Responsible for supporting post-silicon debug effort, issue resolution.
  • Responsible for Diagnostic Tool generation for ATPG, MBIST and bring-up on ATE.
  • Developing, enhancing and maintaining scripts as necessary.

Preferred Experience:

  • Bachelor's degree in Computer Science, Electrical/Electronics Engineering
  • 7 to 15 years experience in ASIC/DFT - simulation and Silicon validation.
  • Should have worked in at least one Full chip DFT
  • Detailed knowledge on DFT concepts, pattern simulation, Silicon debug and yield enhancement.
  • In-depth knowledge and hands-on experience in ATPG - coverage analysis.
  • In-depth knowledge of Memory verification, repair and failure root-cause analysis.
  • Experience with any of these tools is required: ATPG - TestKompress, MBIST - MentorETVerify, Simulation - VCS (preferred), ModelSim.
  • Expertise in scripting languages such as Perl, shell, etc. is an added advantage.
  • Ability to work in an international team, dynamic environment with good communication skills.
  • Ability to learn and adapt to new tools, methodologies.
  • Ability to do multi-tasking & work on several high-priority designs in parallel.

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About Company

Job ID: 151398149

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