Sed, Jtag, Awk, Tcl, debug skills, MBIST, gate-level simulation, Spyglass-DFT, test cost reduction analysis, Dft, ATPG, scan-stitching, Scan, scripting skills, LBIST, Tessent flow

boundary scan , Jtag, physical design constraints, Sta, Synthesis, verification flows, MBIST, SSN, Rtl Design, ICL, DFT architecture, OCC Integration, Scan Insertion, ATPG, pdl, Scan ATPG, LBIST, IJTAG

Sed, Jtag, Awk, Tcl, debug skills, MBIST, gate-level simulation, Spyglass-DFT, test cost reduction analysis, Dft, ATPG, scan-stitching, Scan, scripting skills, LBIST, Tessent flow, post silicon support

boundary scan , ATPG (Automatic Test Pattern Generation), LBIST (Logic Built-In Self-Test), DFT DRC (Design Rule Checking), Jtag, Perl, Python, Tcl, LINT, ASIC design flow, cdc, Scan compression, Scan stitching, Low power DFT Techniques, RTL Coding, ATPG Coverage improvement, DFT STA Constraint development, Analog Phy DFT

SSN, MBIST, LBIST, Scan Insertion, IEEE1149.1 JTAG, IJTAG

Sed, Jtag, Awk, Tcl, DFT features, debug skills, MBIST, gate-level simulation, Spyglass-DFT, test cost reduction analysis, ATPG, scan-stitching, Scan, scripting skills, LBIST, Tessent flow, post silicon support

Unix, Linux Os, Verilog, Tcl, Ruby, Jtag, Python, Perl, Scripting Languages, SV, MBIST, IO-PHY loopback testing, systemverilog, DFT feature verification, file version control, EDA simulation tools, Cadence NCSIM, UVM verification methodologies, Verdi, SVA, Synopsys VCS, fuse, Scan, debug tools