Pre-silicon DFT verification, Post-silicon validation, Yield improvement, BSCAN, Hierarchical multi-core test strategies, MBIST, Scripting and automation, Scan compression, GLS, Power-aware DFT, ATPG simulation, ATPG, Debug, DFT timing closure, LBIST, ATE test program development, Coverage closure, IJTAG, Silicon bring-up

logic bist , DFT architecture, Functional BIST, Digital design flows, Scan compression, SoC MCU architecture, DFT protocols

Dft, MBIST, LBIST, ATPG, Scan Insertion, GLS

occ, Memory-BIST, DFT architecture scan Insertion compression at core level and SoC level, SSN architecture, timing and no-timing simulations, clock architecture, ATPG pattern generation coverage analysis