Intrinsic Reliability Lead / Head Semiconductor Device Reliability
- Location: Dholera / Ahmedabad, Gujarat, India
- Work Mode: Onsite
- Experience: 15+ Years
Role Overview
Lead the development of semiconductor intrinsic and product reliability capability for a new semiconductor manufacturing organization. Responsible for establishing reliability laboratories, defining reliability methodologies, driving qualification programs, and building high-performing reliability teams. This role requires deep expertise in semiconductor device failure mechanisms, accelerated testing, reliability modelling, and technology qualification.
Key Responsibilities
- Define intrinsic and product-level reliability requirements.
- Establish and operationalize reliability laboratories and testing infrastructure.
- Procure and qualify reliability test and monitoring equipment.
- Develop standardized reliability test procedures and methodologies.
- Support R&D and technology transfer programs through reliability analysis.
- Lead intrinsic and product reliability qualification strategies.
- Develop reliability models for device aging and degradation.
- Analyze semiconductor failure mechanisms and qualification data.
- Build and lead global cross-functional reliability teams.
- Drive customer confidence through reliability assurance programs.
- Present reliability results to executive leadership and customers.
- Support new technology introduction and manufacturing qualification.
Required Qualifications
- M.S. or PhD in Physics, Electrical Engineering, Materials Science, or related discipline.
- 15+ years of semiconductor industry experience.
- Proven experience establishing advanced semiconductor reliability laboratories.
- Strong background in intrinsic device reliability and product reliability.
Technical Skills Device Reliability
- Intrinsic Reliability
- Product Reliability
- Device Reliability
- Reliability Qualification
Failure Mechanisms
- Hot Carrier Injection (HCI)
- Time Dependent Dielectric Breakdown (TDDB)
- Negative Bias Temperature Instability (NBTI)
- Electromigration (EM)
- Stress Migration (SM)
Accelerated Testing
- HTOL
- HTRB
- HTGB
- Accelerated Reliability Testing
- Reliability Monitoring
Reliability Modeling
- Aging Models
- Lifetime Prediction
- Reliability Statistics
- Design of Experiments (DOE)
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