Design-for-Excellence (DFX) strategy, Automation Frameworks, SoC clocking, Reset, AI-driven methodologies, BSCAN, Performance and power trade-offs, coverage analysis, MBIST, Verification, power management, DFT Design and Integration, ATPG, SoC chiplet and IP design, DFX architecture, JTAG 1149.x boundary scan, Low-power design architectures, Scan, Manufacturing test requirements, Debug and test features, AI-assisted engineering workflows