Tcl, Jtag, Awk, Sed, Dft, MBIST, Gate-level simulation, ATPG pattern generation, Tessent ATPG, Post-silicon bring up, Scan-stitching, Spyglass-DFT, Debug skills, Scan Insertion, Test cost reduction analysis, Scan, ATPG patterns verification, Scripting skills, LBIST, BISR implementation, Tessent flow