occ, Memory-BIST, DFT architecture scan Insertion compression at core level and SoC level, SSN architecture, timing and no-timing simulations, clock architecture, ATPG pattern generation coverage analysis

Pre-silicon DFT verification, Post-silicon validation, Yield improvement, BSCAN, Hierarchical multi-core test strategies, MBIST, Scripting and automation, Scan compression, GLS, Power-aware DFT, ATPG simulation, ATPG, Debug, DFT timing closure, LBIST, ATE test program development, Coverage closure, IJTAG, Silicon bring-up

Vcs, Perl, Python, Tcl, ATPG Fault Models, DFT Debugging, Siemens Tessent, Synopsys TestMAX, End-to-end DFT implementation, RTL SoC Design Flow, Cadence Modus, STA Timing Closure, MBIST LBIST, DFT Sign-off Fault Coverage, JTAG Boundary Scan – IEEE 1149.1, Scan Insertion Compression