Sed, Jtag, Awk, Tcl, Dft, Tessent, ATPG, Scan, MBIST, LBIST, Spyglass-DFT

scan patterns generation, SSN OCC TAP verification, multi die DFT, Post silicon debug, ICL simulations, ATPG, scan-stitching, Tessent ATPG, timing and no-timing simulations, Pattern retargeting