boundary scan , Jtag, Automation Frameworks, AI-driven methodologies, SOC design, low-power design architectures, MBIST, DFT methodologies, Scan, advanced debug and test features, ATPG, DFX architecture

boundary scan , Jtag, Automation Frameworks, advanced debug and test features, AI-driven methodologies, SOC design, ATPG, DFX architecture, MBIST, DFT methodologies, Scan