Sed, Jtag, Awk, Tcl, DFT features, debug skills, MBIST, gate-level simulation, Spyglass-DFT, test cost reduction analysis, ATPG, scan-stitching, Scan, scripting skills, LBIST, Tessent flow, post silicon support

Sed, Jtag, Awk, Tcl, LBIST, Dft, Tessent, ATPG, Scan, MBIST, gate-level simulation, Spyglass-DFT