test program development , Correlation, test hardware development, Burn-In Boards, final test, Probe Cards, Advantest V93K, Failure Analysis, test data analytics, wafer sort, Silicon Characterization, Load Boards, ATE test development, yield improvement, shmoo analysis, statistical methods, Burn-In

Predictive Modeling, Machine Learning, Java, Python, Doe, Correlation analysis, Spc, Ai, anomaly detection, Statistical methods