Integrated Circuit Processing, Chemistry, Fmea, Spc, FDC Methodology, Semiconductor Devices, Wet Processing, Material Science, 8D, Process Monitoring and Control Methodologies, Chemical Engineering

Process Modeling, Statistical Analysis, process mass balances, purification techniques, process design control, Process Validation, Technology Transfer, cGMP concepts

Excel, Industrial Engineering, Root Cause Analysis, Statistical Process Control, Lean Manufacturing, 5S

local EHS regulations, ISO 14001 Environmental Management, environmental IH Ergonomics, Microsoft Applications, ISO 45001 Occupational Health Safety, Occupational Health Safety, EHS permit applications and renewal, ISO 50001 Energy Management, hazardous material control process

statistical data analysis , process monitoring methodologies, process development, Spc, FDC, 8D, plasma etching fundamentals, Root Cause Analysis, dry etch processes, silicon etch, Dmaic, process troubleshooting, APC, oxide etch, profile control, Doe, process control systems, process characterization

Measurement instruments, cvd, Fmea, Thin Film Equipment, PROMIS DC OP, Wafer fabrication, Ms Office Applications, PVD, Jmp, SPC charts

Process yield improvement, Vision programming, Process analytical skill, COPQ reduction, Six-sigma, Robotics control software

statistical data analysis , process monitoring methodologies, process development, Spc, FDC, 8D, plasma etching fundamentals, Root Cause Analysis, dry etch processes, silicon etch, Dmaic, process troubleshooting, APC, oxide etch, profile control, Doe, process control systems, process characterization