fib, CSAM, IV curve tracer, Oscilloscope, Ion Miller, micro-prober, bench tester, FA tools and techniques, 3D X-ray, Ate, EDX, Sem, Thermal EMMI

dry etch, cross section analysis, delayer techniques, polish wheel, acid hood operation, STEM lamella creation, Sem, dual beam FIB, Focused Ion Beam, physical analysis tools, slice and view images, TEM, AI-assisted tools

Quality Control, Spc, physical characterisation, cleanroom protocols, SRP, product failure analysis, testing cycle time, Microsoft Office Word, IMTE calibration, EDX, laboratory procedures, Sem

bench test equipment, ATE platforms, Advantest V93K, handlers, semiconductor test equipment, HTOL reliability testing, thermostream systems, probers, ATE testers