Statistical Tools, Fmea, Problem solving tools, Spin tool, WET Benches, Mechanical Systems, 8D, Plc Programming, Semitool, Wet Equipment, Siconnex, Microsoft Office Applications

Risk Assessment, PVD ENDURA 5500, ishikawa, Root Cause tools, 8D, Thin film PVD

failure analysis methodologies, semiconductor data monitoring systems, Spc, FDC, ASML PAS XT lithography platforms

promis , measurement instruments, Ms Office Applications, SPC charts

Software Troubleshooting, leak detection, particle contamination analysis, Preventive Maintenance, Fmea, semiconductor manufacturing equipment, Spc, 8D, RF Systems, Rca, Lean Manufacturing, Six Sigma, vacuum systems, equipment reliability