Sed, Jtag, Awk, Tcl, Scan Insertion, Post-silicon bring up, Coverage correlation, Tessent ATPG, MBIST, Gate-level simulation, Spyglass-DFT, Debug skills, Test cost reduction analysis, ATPG, Scripting skills, Scan, BISR implementation, ATPG pattern generation, Scan-stitching, LBIST