IP test engineering, ASIC RTL Design, SoC characterization, PVT characterization, Tensor operations, Optimized data paths, High-Speed IO and Mixed Signal IPs, Quantization techniques, Diagnostic data pipelines, Low-precision arithmetic, Agentic AI flows, ATE and SLT platforms, AI ML-based fault isolation techniques, Hardware acceleration for machine learning, Guard band definition, Matrix computations, Yield diagnostics

Python, VBT, ATE software development, Teradyne Flex, VI-meter, IG-XL, Oscilloscope, 93K ATE systems, analyzers, Signal Generator, Digital AMS Test Development