Statistical Analysis, advanced process control methodologies, immersion lithography, OPC development, photolithography processes, material characterization, Optics, polarized illumination, lithography simulation tools, reticle layout, low k1 imaging, Doe, process window analysis, overlay optimization, Simulation Software

chemical synthesis , modeling strategy, process technology development, semiconductor process technology assessment, surface science, analytic methods, semiconductor processing, memory technologies

Root Cause Analysis, Large dataset interpretation, Statistical data analysis correlation development, Semiconductor process integration and technology development, Optical and e-beam inspection technologies