Jtag, Functional Testing, Sta, DFT techniques, DFT design, IEEE 1500 Standard, scan compression, BSCAN, Simulation, Scan, back-end implementation flows, yield estimation, test optimization, DFT instruments insertion, IJTAG, Synthesis, yield learning, MBIST, SSN, test pattern translation, occ, ATPG, logic diagnosis, Mentor Synopsys test generation tools, Tessent shell flow, DFT AI mindset