C, Spi, I2c, Python, Data Analysis, DFT concepts, Multimeter, production test flows, Spectrum Analyzer, Oscilloscope, ATE test development, I3C, statistical methods

bist , Unix, Tableau, Excel, Python, SmartRDI, Failure analysis techniques, IEEE 1149, Dft, SSN scan diagnostics, Production, characterization, Debug, 1838, SmarTest, PHY, Test method flow development, Streaming Scan Network, MBIST, Test bring-up, Active thermal management, Jmp, ATE Advantest EXAScale-SMT8 test program development, YieldExplorer, 1687, 1500, Scan, Data analysis techniques