statistical data analysis , test time reduction , Spotfire, Excel Vba, Data Power, Excel, Galaxy, Semiconductor quality and automotive standard process control, Yield improvement, Exensio, O plus, Product coordination, Jmp, Bench instruments, Production test floors, Ate, Handlers, CMOS ASIC Design, Probers, ASIC design from concept to mass production, ATE Tester V93K

Spotfire, PCBS, JEDEC AEC Qualification standards, Lab equipment, Curve tracers, Oscilloscopes, Statistics, Spectrum analyzers, Return loss analyzers, ATE tester platforms, Digital Circuits, Failure Analysis, IC packaging knowledge, Electrical Engineering, Bench evaluation, Teradyne Eagle, Integrated circuits

wafer fab , Testing, Ms Office, probe packaging, Failure Analysis, GaN products and technologies, reliability physics, AEC-Q101 qualification standards, data manipulation and analysis, semiconductor manufacturing flow, Jmp

Spotfire, Data Visualization, GRR and TCS analysis, Mbayse, BI HTOL testing, ETS-364, TI systems SWR, ATSS setups, Reliability hardware and test vectors, ATSS Lab Management tools, Eagle platform debug, Qualification plans, CDDS loading, Data-driven problem solving, ETS-88, Bench testing, Test Development, ARC MB generation, Failure Analysis, Power-device characterization, Debug, ETS-800

Reliability tests and methods, Reliability Engineering, GaN HEMT devices technology, Fmea, Wide Bandgap Technologies, Product Qualification, JEDEC, quality engineering, Failure Analysis, AECQ, 8D

Prototyping, Testing, Pro E Modules, Electrical Systems, Machining, Sheet Metal, Project Management, Casting, Dfmea, Mechanical Engineering, Manufacturing of Plastics, Materials Sciences, DVP

SAP, PLC/HMI, Vfd, Power Distribution, Autocad, Electrical Engineering