Automation Scripting, Power Bi, Sql, Jtag, Excel, Python, DFT features, yield analysis, AI-assisted solutions, MBIST, CREST, Jmp, data-driven decision making, Silicon Characterization, Scan, Statistical Modeling, semiconductor test methodologies

Automation Scripting, yield analysis, Silicon Characterization, Statistical Modeling, AI-assisted solutions, semiconductor test methodologies, data-driven decision making